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The impact of scaled channel length in tunneling field effect transistors (TFETs)

date accessioned2020-03-12T21:00:57Z
date available2020-03-12T21:00:57Z
date issued2014
identifier other6920814.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1033993?show=full
formatgeneral
languageEnglish
publisherIEEE
titleThe impact of scaled channel length in tunneling field effect transistors (TFETs)
typeConference Paper
contenttypeMetadata Only
identifier padid8159810
subject keywordsBayes methods
subject keywordsbusiness communication
subject keywordslearning (artificial intelligence)
subject keywordsnext generation networks
subject keywordsNGN
subject keywordsbusiness flow identification technology
subject keywordsintelligent identification function
subject keywordsnetwork business identification key technology
subject keywordsnetwork business identification mechanism
subject keywordsnext generation network
subject keywordssystematic model
subject keywordsAccuracy
subject keywordsBusiness
subject keywordsEngines
subject keywordsPayloads
subject keywordsPorts (Computers)
subject keywordsProtocols
subject keywordsTesting
identifier doi10.1109/ICSESS.2014.6933641
journal titleemiconductor Electronics (ICSE), 2014 IEEE International Conference on
filesize1317172
citations0
contributor rawauthorRahman, Nurul Huda Abdul , Arshad, M.K.Md , Othman, Noraini , Fathil, M.F.M. , Humaira, M.S.Nur , Hashim, U.


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