An efficient way of detecting memory errors in JPEG2000
Author:
Publisher:
Year
: 2014DOI: 10.1109/WiPDA.2014.6964623
Keyword(s): Capacitors,Inductors,Logic gates,MOSFET,Optical switches,Silicon carbide,10 kV SiC MOSFET,PEBB,SiC module,characterization,power electronics building block,simulation
Collections
:
-
Statistics
An efficient way of detecting memory errors in JPEG2000
Show full item record
| contributor author | Raj, M.Pradeep , Dinesh, E. | |
| date accessioned | 2020-03-12T20:56:59Z | |
| date available | 2020-03-12T20:56:59Z | |
| date issued | 2014 | |
| identifier other | 6915409.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1031571?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | An efficient way of detecting memory errors in JPEG2000 | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8157098 | |
| subject keywords | Capacitors | |
| subject keywords | Inductors | |
| subject keywords | Logic gates | |
| subject keywords | MOSFET | |
| subject keywords | Optical switches | |
| subject keywords | Silicon carbide | |
| subject keywords | 10 kV SiC MOSFET | |
| subject keywords | PEBB | |
| subject keywords | SiC module | |
| subject keywords | characterization | |
| subject keywords | power electronics building block | |
| subject keywords | simulation | |
| identifier doi | 10.1109/WiPDA.2014.6964623 | |
| journal title | omputation of Power, Energy, Information and Communication (ICCPEIC), 2014 International Conference | |
| filesize | 1507274 | |
| citations | 0 |