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Dependence of device performances on fin dimensions in AlGaN/GaN recessed-gate nanoscale FinFET

date accessioned2020-03-12T20:42:21Z
date available2020-03-12T20:42:21Z
date issued2014
identifier other6884475.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1022528?show=full
formatgeneral
languageEnglish
publisherIEEE
titleDependence of device performances on fin dimensions in AlGaN/GaN recessed-gate nanoscale FinFET
typeConference Paper
contenttypeMetadata Only
identifier padid8147301
subject keywordsLinux
subject keywordsfuzzy set theory
subject keywordsoperating system kernels
subject keywordssoftware maintenance
subject keywordssoftware quality
subject keywordssoftware reliability
subject keywordsEinstein operation-based aggregation algorithm
subject keywordsIFSDA
subject keywordsLinux kernels
subject keywordsgrade mapping method
subject keywordsintuitionistic fuzzy set-based data aggregation
subject keywordsmembership function
subject keywordssoftware maintainability evaluation
subject keywordssoftware quality
subject keywordssoftware trustworthiness
subject keywordsAggregates
subject keywordsCorrelation
subject keywordsIndexes
subject keywordsKernel
subject keywordsLinux
subject keywordsMeasurement
subject keywordsData Aggregation
subject keywordsHeterogeneous Data
subject keywordsIntuitionistic Fuzzy Set
subject keywordsSoftware Maintaina
identifier doi10.1109/FSKD.2014.6980839
journal titleonsumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
filesize194556
citations0
contributor rawauthorGwan Min Yoo , Jae Hwa Seo , Young Jun Yoon , Young Jae Kim , Sung Yoon Kim , Hye Su Kang , Hye Rim Eun , Ra Hee Kwon , Young In Jang , In Man Kang , Seong Min Lee , Seongjae Cho


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