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Fast depth evaluation from pattern projection in conjunction with connected component labeling

contributor authorJong-Rul Park , Jun-dong Cho
date accessioned2020-03-12T20:42:19Z
date available2020-03-12T20:42:19Z
date issued2014
identifier other6884462.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1022515?show=full
formatgeneral
languageEnglish
publisherIEEE
titleFast depth evaluation from pattern projection in conjunction with connected component labeling
typeConference Paper
contenttypeMetadata Only
identifier padid8147288
subject keywordsarrayed waveguide gratings
subject keywordselemental semiconductors
subject keywordsintegrated optoelectronics
subject keywordsoptical communication equipment
subject keywordsoptical crosstalk
subject keywordsoptical losses
subject keywordsoptical modulation
subject keywordsoptical switches
subject keywordsphase modulation
subject keywordssilicon
subject keywordssilicon-on-insulator
subject keywordsAWG
subject keywordsSi
subject keywordscrosstalk
subject keywordsfast 4-channel silicon switch
subject keywordsinsertion loss
subject keywordsinterdigitated carrier depletion based silicon modulators
subject keywordsoptical phased array based switch
subject keywordsphase modulators
subject keywordssilicon-on-insulator
subject keywordssize 3.2 mm
subject keywordsArrays
subject keywordsOptical losses
subject keywordsOptical switches
subject keywordsOptical
identifier doi10.1109/Group4.2014.6961942
journal titleonsumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
filesize232676
citations0


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