High-frequency integrated gate drivers for half-bridge GaN power stage
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: 2014DOI: 10.1109/PVSC.2014.6925320
Keyword(s): electric current measurement,electric impedance measurement,leakage currents,modules,packaging,photovoltaic power systems,PV module,high voltage system,impedance measurement,leakage current measurement,leakage current path analysis,photovoltaic module,photovoltaic module packaging material,power loss,Current measurement,Laminates,Leakage currents,Packaging,Photovoltaic systems,PV Module,Potential Induced Degradation,Reliability,System Voltage Stress
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High-frequency integrated gate drivers for half-bridge GaN power stage
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| contributor author | Yuanzhe Zhang , Rodriguez, M. , Maksimovic, D. | |
| date accessioned | 2020-03-12T20:34:43Z | |
| date available | 2020-03-12T20:34:43Z | |
| date issued | 2014 | |
| identifier other | 6877120.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1018740 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | High-frequency integrated gate drivers for half-bridge GaN power stage | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8142979 | |
| subject keywords | electric current measurement | |
| subject keywords | electric impedance measurement | |
| subject keywords | leakage currents | |
| subject keywords | modules | |
| subject keywords | packaging | |
| subject keywords | photovoltaic power systems | |
| subject keywords | PV module | |
| subject keywords | high voltage system | |
| subject keywords | impedance measurement | |
| subject keywords | leakage current measurement | |
| subject keywords | leakage current path analysis | |
| subject keywords | photovoltaic module | |
| subject keywords | photovoltaic module packaging material | |
| subject keywords | power loss | |
| subject keywords | Current measurement | |
| subject keywords | Laminates | |
| subject keywords | Leakage currents | |
| subject keywords | Packaging | |
| subject keywords | Photovoltaic systems | |
| subject keywords | PV Module | |
| subject keywords | Potential Induced Degradation | |
| subject keywords | Reliability | |
| subject keywords | System Voltage Stress | |
| identifier doi | 10.1109/PVSC.2014.6925320 | |
| journal title | ontrol and Modeling for Power Electronics (COMPEL), 2014 IEEE 15th Workshop on | |
| filesize | 804446 | |
| citations | 0 |