| date accessioned | 2020-03-12T20:34:41Z | |
| date available | 2020-03-12T20:34:41Z | |
| date issued | 2014 | |
| identifier other | 6877108.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1018729?show=full | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Sponsors | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8142967 | |
| subject keywords | adhesion | |
| subject keywords | elemental semiconductors | |
| subject keywords | nondestructive testing | |
| subject keywords | numerical analysis | |
| subject keywords | silicon | |
| subject keywords | solar cells | |
| subject keywords | soldering | |
| subject keywords | surface roughness | |
| subject keywords | Si | |
| subject keywords | bus bar surface roughness measures | |
| subject keywords | crystalline silicon solar cell | |
| subject keywords | nondestroyed method | |
| subject keywords | numerical method | |
| subject keywords | photovoltaic application | |
| subject keywords | screen-printing performance | |
| subject keywords | soldering adhesion forecast modelling | |
| subject keywords | soldering adhesion test | |
| subject keywords | soldering failure | |
| subject keywords | Adhesives | |
| subject keywords | Microscopy | |
| subject keywords | Numerical models | |
| subject keywords | Optical imaging | |
| subject keywords | Optical microscopy | |
| subject keywords | Reliability | |
| subject keywords | Semiconductor device modelin | |
| identifier doi | 10.1109/PVSC.2014.6925319 | |
| journal title | ontrol and Modeling for Power Electronics (COMPEL), 2014 IEEE 15th Workshop on | |
| filesize | 812408 | |
| citations | 0 | |
