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Safe operation region characterization for quantifying the reliability of CMOS logic affected by process variations

contributor authorKhalid, U. , Mastrandrea, A. , Olivieri, M.
date accessioned2020-03-12T20:28:44Z
date available2020-03-12T20:28:44Z
date issued2014
identifier other6872763.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1016046?show=full
formatgeneral
languageEnglish
publisherIEEE
titleSafe operation region characterization for quantifying the reliability of CMOS logic affected by process variations
typeConference Paper
contenttypeMetadata Only
identifier padid8139817
subject keywordsFeature extraction
subject keywordsHistograms
subject keywordsImage color analysis
subject keywordsImage edge detection
subject keywordsSemantics
subject keywordsVectors
subject keywordsVideo sequences
subject keywordsContent-based Information Retrieval
subject keywordsMotion-based Video Retrieval
subject keywordsVideo Retrieval
identifier doi10.1109/ISM.2014.38
journal titleicroelectronics and Electronics (PRIME), 2014 10th Conference on Ph.D. Research in
filesize704368
citations0


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