Show simple item record

date accessioned2020-03-12T20:24:57Z
date available2020-03-12T20:24:57Z
date issued2014
identifier other6868814.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1013705?show=full
formatgeneral
languageEnglish
publisherIEEE
titleAn intra-cell defect grading tool
typeConference Paper
contenttypeMetadata Only
identifier padid8136851
subject keywordsBiosensors
subject keywordsElectrodes
subject keywordsGold
subject keywordsImpedance
subject keywordsImpedance measurement
subject keywordsSilicon
subject keywordsAvidin-Biotin
subject keywordsBiosensor
subject keywordsElectrochemical impedance spectroscopy
subject keywordsnano-structured electrode
identifier doi10.1109/ICSENS.2014.6985331
journal titleesign and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
filesize273068
citations0
contributor rawauthorBosio, A. , Dilillo, L. , Girard, P. , Todri-Sanial, A. , Virazel, A. , Bernabovi, S. , Bernardi, P.


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record