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: 2014شناسه الکترونیک: 10.1109/PVSC.2014.6925229
کلیدواژه(گان): EBIC,focused ion beam technology,solar cells,CdS-CdTe,carrier collection,cleaving,cross-sectional EBIC measurements,depletion region,electron beam induced current,focused ion beam milling,mobility-lifetime product,photovoltaic cells,Analytical models,Gold,Materials,CdTe,Electron beam induced current
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date accessioned | 2020-03-12T20:24:44Z | |
date available | 2020-03-12T20:24:44Z | |
date issued | 2014 | |
identifier other | 6868680.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1013575 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Contents | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8136667 | |
subject keywords | EBIC | |
subject keywords | focused ion beam technology | |
subject keywords | solar cells | |
subject keywords | CdS-CdTe | |
subject keywords | carrier collection | |
subject keywords | cleaving | |
subject keywords | cross-sectional EBIC measurements | |
subject keywords | depletion region | |
subject keywords | electron beam induced current | |
subject keywords | focused ion beam milling | |
subject keywords | mobility-lifetime product | |
subject keywords | photovoltaic cells | |
subject keywords | Analytical models | |
subject keywords | Gold | |
subject keywords | Materials | |
subject keywords | CdTe | |
subject keywords | Electron beam induced current | |
identifier doi | 10.1109/PVSC.2014.6925229 | |
journal title | igital Technologies (DT), 2014 10th International Conference on | |
filesize | 123542 | |
citations | 0 |