| date accessioned | 2020-03-12T20:16:14Z | |
| date available | 2020-03-12T20:16:14Z | |
| date issued | 2014 | |
| identifier other | 6860618.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1008291?locale-attribute=fa&show=full | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Systematic reliability characterizations on Average Output Voltage (AVO) shift of Display Driver IC by HTOL | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8130119 | |
| subject keywords | Ash | |
| subject keywords | Cameras | |
| subject keywords | Clouds | |
| subject keywords | Corona | |
| subject keywords | Joining processes | |
| subject keywords | Lightning | |
| subject keywords | Radar | |
| subject keywords | attachment process | |
| subject keywords | bolt-from-the-blue | |
| subject keywords | corona | |
| subject keywords | high-speed camera | |
| subject keywords | lightning | |
| subject keywords | space stem | |
| identifier doi | 10.1109/ICLP.2014.6973326 | |
| journal title | eliability Physics Symposium, 2014 IEEE International | |
| filesize | 342307 | |
| citations | 0 | |
| contributor rawauthor | Jungdong Kim , Donghun Kim , Minhyeok Choe , Kidan Bae , Sangchul Shin , Sangwoo Pae , Jongwoo Park | |
