Zero voltage switching characterization of 12 kV SiC N-IGBTs
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Year
: 2014DOI: 10.1109/PHM.2014.6988123
Keyword(s): Fatigue,Joints,Load modeling,Loading,Stress,Thermal loading,Vibrations,Life Prediction,Physics of Failure,Residual Strength Reliability,Thermal Fatigue,Vibration Fatigue
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Zero voltage switching characterization of 12 kV SiC N-IGBTs
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| date accessioned | 2020-03-12T20:11:08Z | |
| date available | 2020-03-12T20:11:08Z | |
| date issued | 2014 | |
| identifier other | 6856048.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1005080 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Zero voltage switching characterization of 12 kV SiC N-IGBTs | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8126499 | |
| subject keywords | Fatigue | |
| subject keywords | Joints | |
| subject keywords | Load modeling | |
| subject keywords | Loading | |
| subject keywords | Stress | |
| subject keywords | Thermal loading | |
| subject keywords | Vibrations | |
| subject keywords | Life Prediction | |
| subject keywords | Physics of Failure | |
| subject keywords | Residual Strength Reliability | |
| subject keywords | Thermal Fatigue | |
| subject keywords | Vibration Fatigue | |
| identifier doi | 10.1109/PHM.2014.6988123 | |
| journal title | ower Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium o | |
| filesize | 681047 | |
| citations | 0 | |
| contributor rawauthor | Kadavelugu, A. , Bhattcharya, S. , Baliga, B.J. , Sei-Hyung Ryu , Grider, D. , Palmour, J. |