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    Positive bias temperature instability in MOSFETs 

    Type: Journal Paper
    Author : Zhang, J.F.; Eccleston, W.
    Year: 1998
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    Time-dependent device-to-device variation accounting for within-device fluctuation (TVF): A new characterization technique 

    Type: Conference Paper
    Author : Zhang, J.F.; Meng Duan; Zhigang Ji; Weidong Zhang
    Publisher: IEEE
    Year: 2014

    The effect of dietary supplementation with the natural carotenoids curcumin and lutein on broiler pigmentation and immunity 

    Type: Journal Paper
    Author : Rajput, N.; Naeem, M.; Ali, S.; Zhang, J. F.; Zhang, L.; Wang, T.
    Publisher: Poultry Science Association
    Year: 2013
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    Non linear ultrasonic response of plastically deformed aluminium alloy AA 7009 

    Type: Journal Paper
    Author : Zhang, J.F. - Xuan, F. - Xiang, Y.X. - Yang, F.Q.
    Publisher: Institute of Materials, Minerals and Mining
    Year: 2013

    Instabilities induced by electron trapping/detrapping in high-k gate dielectrics of Flash memories: Evaluation and suppression 

    Type: Conference Paper
    Author : Robinson, C.; Zhang, W.D.; Baojun Tang; Zheng, X.F.; Zhang, J.F.
    Publisher: IEEE
    Year: 2014

    Voltage stability analysis considering the uncertainties of dynamic load parameters 

    Type: Journal Paper
    Author : Zhang, J.F.; Tse, C.T.; Wang, K.W.; Chung, C.Y.
    Year: 2009
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