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Author : Damoiseaux, R.; George, S.; Li, M.; Pokhrel, S.; Ji, Z.; France, B.; Xia, T.; Suarez, E.; Rallo, R.; MÃ¤dler, L.; Cohen, Y.; Hoek, E. M. V.; Nel, A.

Year: 2011

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Cryogenic cooling-induced process performance and surface integrity in drilling CFRP composite material

Eclipsing Z-scan measurement of λ/10^4 wave-front distortion

Augmented electric field integral equation for dielectric problems in the twilight zone

No time to loseâ high throughput screening to assess nanomaterial safety

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Cryogenic cooling-induced process performance and surface integrity in drilling CFRP composite material

Eclipsing Z-scan measurement of λ/10^4 wave-front distortion

Augmented electric field integral equation for dielectric problems in the twilight zone

No time to loseâ high throughput screening to assess nanomaterial safety