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    In-situ characterization of 2D materials for beyond CMOS applications 

    Type: Conference Paper
    Author : Wallace, Robert M.
    Publisher: IEEE
    Year: 2014

    High-κ Dielectric Materials for Microelectronics 

    Type: Journal Paper
    Author : Wallace, Robert M.; Wilk, Glen D.
    Publisher: Taylor and Francis Group
    Year: 2003
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    Impact of Interfacial Oxygen Content on Bonding, Stability, Band Offsets, and Interface States of GaAs:HfOr 2r Interfaces 

    Type: Journal Paper
    Author : Wang, Weichao; Xiong, Ka; Wallace, Robert M.; Cho, Kyeongjae
    Year: 2010
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    Metal–Graphene–Metal Sandwich Contacts for Enhanced Interface Bonding and Work Function Control 

    Type: Journal Paper
    Author : Gong, Cheng; Hinojos, David; Wang, Weichao; Nijem, Nour; Shan, Bin; Wallace, Robert M.; Cho, Kyeongjae; Chabal, Yves J.
    Year: 2012
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    Atomic Layer Deposition of Dielectrics on Graphene Using Reversibly Physisorbed Ozone 

    Type: Journal Paper
    Author : Jandhyala, Srikar; Mordi, Greg; Lee, Bongki; Lee, Geunsik; Floresca, Carlo; Cha, Pil-Ryung; Ahn, Jinho; Wallace, Robert M.; Chabal, Yves J.; Kim, Moon J.
    Year: 2012
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    Nitrogen doping of graphene and its effect on quantum capacitance, and a new insight on the enhanced capacitance of N-doped carbon 

    Type: Journal Paper
    Author : Zhang, Li Li; Zhao, Xin; Ji, Hengxing; Stoller, Meryl D.; Lai, Linfei; Murali, Shanthi; Mcdonnell, Stephen; Cleveger, Brandon; Wallace, Robert M.; Ruoff, Rodney S.
    Year: 2012
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    Triangular-Pulse Measurement for Hysteresis of High-Performance and Flexible Graphene Field-Effect Transistors 

    Type: Journal Paper
    Author : Saungeun Park; Sangchul Lee; Mordi, G.; Jandhyala, Srivatsava; Min-Woo Ha; Jang-Sik Lee; Colombo, Luigi; Wallace, Robert M.; Byoung Hun Lee; Jiyoung Kim
    Publisher: IEEE
    Year: 2014

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