Search

English
- Persian
- English
Login

Ferdowsi University of Mashhad
|
Information Center and Central Library

- Persian
- English

Home
Source Types
- Journal Paper
- Ebook
- Conference Paper
- Standard
- Protocol
- Thesis
Use Help

FUM Digital Library
Search

FUM Digital Library
Search

All Fields
Title
Author
Year
Publisher
Subject
Publication Title
ISSN
DOI
ISBN

Advanced Search

JavaScript is disabled for your browser. Some features of this site may not work without it.

Search

Show Advanced Filters Hide Advanced Filters

Filters

Use filters to refine the search results.

Now showing items 1-3 of 3

Relevance
Title Asc
Title Desc
Year Asc
Year Desc

5
10
20
40
60
80
100

CSV
RIS

Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100

Aging-aware critical paths in deep submicron

Type: Conference Paper

Author : Alladi, P. , Tragoudas, S.

Publisher: IEEE

Year: 2014

ATPG for transition faults of pipelined threshold logic circuits

Type: Conference Paper

Author : Palaniswamy, A.K. , Tragoudas, S. , Haniotakis, T.

Publisher: IEEE

Year: 2014

Diagnosis of segment delay defects with current sensing

Type: Conference Paper

Author : Aljubouri, W.; Somashekar, A.M.; Haniotakis, T.; Tragoudas, S.

Publisher: IEEE

Year: 2014

Author

Aljubouri, W. (1)

Alladi, P. , Tragoudas, S. (1)

Haniotakis, T. (1)

Palaniswamy, A.K. , Tragoudas, S. , Haniotakis, T. (1)

Somashekar, A.M. (1)

Tragoudas, S. (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

Adaptive optics (1)

Authentication (1)

chromatic aberration (1)

color difference model (1)

Color fringe correction (1)

Educational institutions (1)

Filtering (1)

guided image filtering (1)

Image color analysis (1)

Image fusion (1)

Type

Conference Paper (3)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

efect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposiu (1)

esign &amp; Technology of Integrated Systems In Nanoscale Era (DTIS), 2014 9th IEEE Internationa (1)

n-Line Testing Symposium (IOLTS), 2014 IEEE 20th International (1)

About Us

نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش

DSpace software copyright © 2019-2022 DuraSpace