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Now showing items 1-4 of 4
Resilience and yield of flip-flops in future CMOS technologies under process variations and aging
Publisher: IET
Year: 2014
Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic
Publisher: IEEE
Year: 2014
Architectural and Circuit Design Techniques for Power Management of Ultra-Low-Power MCU Systems
Publisher: IEEE
Year: 2014
Power efficient digital IC design for a medical application with high reliability requirements
Publisher: IEEE
Year: 2014