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    Role of Injection Barrier in Capacitance-Voltage Measurements of Organic Devices 

    Type: Journal Paper
    Author : Nigam, Abhishek; Nair, P.R.; Premaratne, Malin; Rao, Valipe Ramgopal
    Publisher: IEEE
    Year: 2014

    A 130.7-<formula formulatype="inline"> <img src="/images/tex/16996.gif" alt="\\hbox {mm}^{2}"> </formula> 2-Layer 32-Gb ReRAM Memory Device in 24-nm Technology 

    Type: Journal Paper
    Author : Tz-yi Liu; Tian Hong Yan; Scheuerlein, R.; Yingchang Chen; Lee, Jung Keun; Balakrishnan, Ganesh; Yee, G.; Zhang, Haijun; Yap, A.; Ouyang, Jun; Sasaki, T.; Al-Shamma, Ali; Chen, Ci; Gupta, Madhu; Hilton, Gene; Kathuria, A.; Lai, V.; Matsumoto, Morio; Nigam, Abhishek; Pai, A.; Pakhale, J.; Chang Hua Siau; Xiaoxia Wu; Yibo Yin; Nagel, Nick; Tanaka, Yuichi; Higashitani, M.; Minvielle, T.; Gorla, C.; Tsukamoto, Tadaaki; Yamaguchi, Toru; Okajima, M.; Okamura, Takahiro
    Publisher: IEEE
    Year: 2014

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