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[IEEE 2005 42nd Design Automation Conference - Anaheim, CA, USA (2005.06.13-2005.06.17)] Proceedings. 42nd Design Automation Conference, 2005. - OPERA: optimization with ellipsoidal uncertainty for robust analog IC design

Type: Journal Paper

Author : Yang Xu,; Xin Li,; Kan-Lin Hsiung,; Boyd, S.; Nausieda, I.

Year: 2005

Bias-Stress Effect in Pentacene Organic Thin-Film Transistors

Type: Journal Paper

Author : Ryu, K.K.; Nausieda, I.; He, D.D.; Akinwande, A.I.; Bulovic, V.; Sodini, C.G.

Publisher: IEEE

Year: 2010

Author

Nausieda, I. (2)

Akinwande, A.I. (1)

Boyd, S. (1)

Bulovic, V. (1)

He, D.D. (1)

Kan-Lin Hsiung, (1)

Ryu, K.K. (1)

Sodini, C.G. (1)

Xin Li, (1)

Yang Xu, (1)

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IEEE (1)

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2010 (1)

2005 (1)

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Journal Paper (2)

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English (2)

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Fulltext (2)

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IEEE Transactions on Electron Devices (1)

Osmania Journal of Social Sciences (1)

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