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    PICav: Precise, Iterative, and Complement-Based Cloud Storage Availability Calculation Scheme 

    Type: Conference Paper
    Author : Spillner, Josef; Muller, Johannes
    Publisher: IEEE
    Year: 2014

    Tutorial on Distributed Data Storage: From Dispersed Files to Stealth Databases 

    Type: Conference Paper
    Author : Spillner, Josef; Muller, Johannes
    Publisher: IEEE
    Year: 2014

    Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon 

    Type: Journal Paper
    Author : Muller, Johannes; Hannebauer, Helge; Mader, Christoph; Haase, Frerk; Bothe, Klaus
    Publisher: IEEE
    Year: 2014

    Multiscale Metabolic Modeling: Dynamic Flux Balance Analysis on a Whole-Plant Scale 

    Type: Journal Paper
    Author : Grafahrend-Belau,Eva; Junker,Astrid; Eschenröder,André; Müller,Johannes; Schreiber,Falk; Junker,Björn H.
    Publisher: American Society of Plant Biologists
    Year: 2013

    Multiferroicity in the Mott Insulating Charge-Transfer Salt <inline-formula> <img src="/images/tex/21765.gif" alt="\\kappa -({\\rm BEDT-TTF})_{2}{\\rm Cu}[{\\rm N}({\\rm CN})_{2}]{\\rm Cl}"> </inline-formula> 

    Type: Journal Paper
    Author : Lang, Michael; Lunkenheimer, Peter; Muller, Johannes; Loidl, Alois; Hartmann, Bjorn; Hoang, Nguyen H.; Gati, Elena; Schubert, Harald; Schlueter, John /A/.
    Publisher: IEEE
    Year: 2014

    Impact of Scaling on the Performance of HfO<sub>2</sub>-Based Ferroelectric Field Effect Transistors 

    Type: Journal Paper
    Author : Yurchuk, Ekaterina; Muller, Johannes; Paul, J.; Schlosser, Till; Martin, Daniel; Hoffmann, Raik; Mueller, Steffen; Slesazeck, Stefan; Schroeder, Ulrik; Boschke, Roman; van Bentum, Ralf; Mikolajick, Thomas
    Publisher: IEEE
    Year: 2014

    A 1024-Channel CMOS Microelectrode Array With 26,400 Electrodes for Recording and Stimulation of Electrogenic Cells In Vitro 

    Type: Journal Paper
    Author : Ballini, Marco; Muller, Johannes; Livi, Paolo; Yihui Chen; Frey, Urs; Stettler, Alexander; Shadmani, Amir; Viswam, Vijay; Lloyd Jones, Ian; Jackel, David; Radivojevic, Milos; Lewandowska, Marta K.; Wei Gong; Fiscella, Michele; Bakkum, Douglas J.; Heer, Flavio; Hierlemann, Andreas
    Publisher: IEEE
    Year: 2014

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