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نمایش تعداد 1-5 از 5
Model of coupled defect level recombination with participation of multiphonons
ناشر: IEEE
سال: 2014
TCAD simulation methodology for 3-D electro-physical and optical analysis
ناشر: IEEE
سال: 2014
Study of Al/a-SiC/c-Si(p)/Al structure prepared by PECVD
ناشر: IEEE
سال: 2014