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Single Event Transients in Digital CMOS—A Review

Type: Journal Paper

Author : Ferlet-Cavrois, Veronique; Massengill, Lloyd W.; Gouker, Pascale

Publisher: IEEE

Year: 2013

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Kernel-Based Circuit Partition Approach to Mitigate Combinational Logic Soft Errors

Type: Journal Paper

Author : Mahatme, N.N.; Gaspard, N.J.; Assis, T.; Chatterjee, I.; Loveless, T.D.; Bhuva, B.L.; Robinson, William H.; Massengill, Lloyd W.; Wen, S.-J.; Wong, Rita

Publisher: IEEE

Year: 2014

Irradiation and Temperature Effects for a 32 nm RF Silicon-on-Insulator CMOS Process

Type: Journal Paper

Author : Haeffner, T.D.; Loveless, T.D.; Zhang, E.X.; Sternberg, A.L.; Jagannathan, Sarangapani; Schrimpf, R.D.; Kauppila, J.S.; Alles, Michael L.; Fleetwood, D.M.; Massengill, Lloyd W.; Haddad, Nadim F.

Publisher: IEEE

Year: 2014

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors

Type: Journal Paper

Author : Alles, Michael L.; Schrimpf, R.D.; Massengill, Lloyd W.; Ball, D.R.; Kelly, Andrew T.; Haddad, Nadim F.; Rodgers, John C.; Ross, Jason F.; Chan, Erwin Hoi Wing; Raman, Ashok; Turowski, Marek

Publisher: IEEE

Year: 2014

Mitigation of Single-Event Charge Sharing in a Commercial FPGA Architecture

Type: Journal Paper

Author : Kelly, Andrew T.; Alles, Michael L.; Ball, D.R.; Massengill, Lloyd W.; Ramaswamy, Srini; Haddad, Nadim F.; Brown, Ronald D.; Fleming, Patrick R.; Chan, Erwin Hoi Wing; Ekanayake, Virantha; Kelly, Clinton W.; Pelosi, Christopher; McMorrow, Dale; Buchner, Stephen P.; Warner, Jeffrey H.; Berg, Melanie D.

Publisher: IEEE

Year: 2014

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Single Event Transients in Digital CMOS—A Review

Kernel-Based Circuit Partition Approach to Mitigate Combinational Logic Soft Errors

Irradiation and Temperature Effects for a 32 nm RF Silicon-on-Insulator CMOS Process

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors

Mitigation of Single-Event Charge Sharing in a Commercial FPGA Architecture

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Single Event Transients in Digital CMOS—A Review

Kernel-Based Circuit Partition Approach to Mitigate Combinational Logic Soft Errors

Irradiation and Temperature Effects for a 32&#x00A0;nm RF Silicon-on-Insulator CMOS Process

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors

Mitigation of Single-Event Charge Sharing in a Commercial FPGA Architecture

Irradiation and Temperature Effects for a 32 nm RF Silicon-on-Insulator CMOS Process