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A 12-bit 32MS/s SAR ADC using built-in self calibration technique to minimize capacitor mismatch

Type: Conference Paper

Author : In-Seok Jung; Yong-Bin Kim

Publisher: IEEE

Year: 2014

A 100MS/s 10-bit Split-SAR ADC with Capacitor Mismatch Compensation Using Built-In Calibration

Type: Journal Paper

Author : Yongsuk Choi; Yong-Bin Kim; In-Seok Jung

Year: 2016

A 10-bit 64MS/s SAR ADC using variable clock period method

Type: Conference Paper

Author : In-Seok Jung; Marvin Onabajo; Yong-Bin Kim

A built-in calibration system with a reduced FFT engine for linearity optimization of low power LNA

Type: Conference Paper

Author : Yongsuk Choi; Chun-hsiang Chang; In-Seok Jung; Onabajo, M.; Yong-Bin Kim

Publisher: IEEE

Year: 2014

Accurate and Efficient On-Chip Spectral Analysis for Built-In Testing and Calibration Approaches

Type: Journal Paper

Author : Chauhan, Himanshu; Yongsuk Choi; Onabajo, Marvin; In-Seok Jung; Yong-Bin Kim

Publisher: IEEE

Year: 2014

Author

In-Seok Jung (5)

Yong-Bin Kim (5)

Yongsuk Choi (3)

Chauhan, Himanshu (1)

Chun-hsiang Chang (1)

Marvin Onabajo (1)

Onabajo, M. (1)

Onabajo, Marvin (1)

Publisher

IEEE (3)

Year

2016 (1)

2014 (3)

Keywords

ADC resolution (1)

amp (1)

analog-to-digital converter (1)

analogue-digital conversion (1)

built-in self test (1)

calibration (1)

calibration approach (1)

CMOS integrated circuits (1)

CMOS technology (1)

coherent sampling (1)

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Conference Paper (3)

Journal Paper (2)

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English (5)

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Metadata Only (3)

Fulltext (2)

Publication Title

efect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposiu (2)

2016 IEEE 25th North Atlantic Test Workshop (NATW) (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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