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نمایش تعداد 1-10 از 19

Electromigration simulation at circuit levels

نوع: Conference Paper

نویسنده : Cher Ming Tan

ناشر: IEEE

سال: 2014

Electromigration Modeling at Circuit Layout Level

نوع: Ebook

نویسنده : Cher Ming Tan; Feifei He

ناشر: Springer

سال: 2013

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Electromigration Modeling at Circuit Layout Level

نوع: Ebook

نویسنده : Cher Ming Tan; Feifei He

ناشر: Springer

سال: 2013

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Solubility, dispersion and bonding of functionalised carbon nanotubes in epoxy resins

نوع: Journal Paper

نویسنده : Baudot, Charles, and Cher Ming Tan.

ناشر: Inderscience Publishers

سال: 2009

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Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

نوع: Journal Paper

نویسنده : Cher Ming Tan; Nagarajan Raghavan

سال: 2010

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Effect of IC layout on the reliability of CMOS amplifiers

نوع: Journal Paper

نویسنده : Feifei He; Cher Ming Tan

سال: 2012

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Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

نوع: Journal Paper

نویسنده : Song Lan; Cher Ming Tan

سال: 2014

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Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test

نوع: Conference Paper

نویسنده : Cher Ming Tan; Narula, U.

ناشر: IEEE

سال: 2014

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

نوع: Journal Paper

نویسنده : Cher Ming Tan; Singh, Prashant

ناشر: IEEE

سال: 2014

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

نوع: Journal Paper

نویسنده : Song Lan; Cher Ming Tan

ناشر: IEEE

سال: 2014

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Electromigration simulation at circuit levels

Electromigration Modeling at Circuit Layout Level

Electromigration Modeling at Circuit Layout Level

Solubility, dispersion and bonding of functionalised carbon nanotubes in epoxy resins

Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

Effect of IC layout on the reliability of CMOS amplifiers

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

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Electromigration simulation at circuit levels

Electromigration Modeling at Circuit Layout Level

Electromigration Modeling at Circuit Layout Level

Solubility, dispersion and bonding of functionalised carbon nanotubes in epoxy resins

Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

Effect of IC layout on the reliability of CMOS amplifiers

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction