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    A Theoretical Framework for Unsupervised Change Detection Based on Change Vector Analysis in the Polar Domain 

    Type: Journal Paper
    Author : Bovolo, F.; Bruzzone, L.
    Publisher: IEEE
    Year: 2007
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    A novel circular approach to change detection in pair of images extracted from image time series 

    Type: Conference Paper
    Author : Bruzzone, L.; Bovolo, F.
    Publisher: IEEE
    Year: 2014

    A Novel Approach to Unsupervised Change Detection Based on a Semisupervised SVM and a Similarity Measure 

    Type: Journal Paper
    Author : Bovolo, F.; Bruzzone, L.; Marconcini, M.
    Publisher: IEEE
    Year: 2008
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    Detection of specific changes in image time series by an adaptive change vector analysis 

    Type: Conference Paper
    Author : Zanotta, D.C.; Bruzzone, L.; Bovolo, F.
    Publisher: IEEE
    Year: 2014

    Rapid and accurate damage detection in built-up areas combining stripmap and spotlight SAR images 

    Type: Conference Paper
    Author : Marin, C.; Bovolo, F.; Bruzzone, L.
    Publisher: IEEE
    Year: 2014

    A novel sequential spectral change vector analysis for representing and detecting multiple changes in hyperspectral images 

    Type: Conference Paper
    Author : Sicong Liu; Bruzzone, L.; Bovolo, F.; Peijun Du
    Publisher: IEEE
    Year: 2014

    A novel neural approach for unsupervised change detection using SOM clustering for pseudo-training set selection followed by CSOM classifier 

    Type: Conference Paper
    Author : Neagoe, V.; Ciurea, A.; Bruzzone, L.; Bovolo, F.
    Publisher: IEEE
    Year: 2014

    Analysis of the Effects of Pansharpening in Change Detection on VHR Images 

    Type: Journal Paper
    Author : Bovolo, F.; Bruzzone, L.; Capobianco, L.; Garzelli, A.; Marchesi, S.; Nencini, F.
    Publisher: IEEE
    Year: 2010
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    Semisupervised One-Class Support Vector Machines for Classification of Remote Sensing Data 

    Type: Journal Paper
    Author : Mũnoz-Marí, J.; Bovolo, F.; Gómez-Chova, L.; Bruzzone, L.; Camp-Valls, G.
    Publisher: IEEE
    Year: 2010
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