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Now showing items 1-8 of 8

In-depth Analysis of SREM Count Rate Measurements for Future Use in EnKF Salammbô Data Assimilation Tool

Type: Journal Paper

Author : Bourdarie, S.; Lazaro, D.; Nieminen, Petteri; Evans, Hugh

Publisher: IEEE

Year: 2014

A New ONERA-CNES Slot Electron Model

Type: Journal Paper

Author : Sicard-Piet, A.; Boscher, D.; Lazaro, D.; Bourdarie, S.; Rolland, G.

Publisher: IEEE

Year: 2014

Radiation Belt Activity Indices and Solar Proton Event Alarm

Type: Journal Paper

Author : Lazaro, D.; Boscher, D.; Bourdarie, S.; Sicard-Piet, A.; Rolland, G.; Ecoffet, R.; Lorfè vre, E.

Publisher: IEEE

Year: 2014

Unfolding JASON-2/ICARE-NG High-Energy Particles Measurements Using a Singular Value Decomposition Approach

Type: Journal Paper

Author : Maget, V.; Bourdarie, S.; Lazaro, D.; Boscher, D.; Rolland, G.; Ecoffet, R.; Lorfè vre, E.

Publisher: IEEE

Year: 2014

Correlation of In-Flight Displacement Damage on the OSL Sensor With Space Environment On-Board Jason-2 Spacecraft

Type: Journal Paper

Author : Bourdarie, S.; Falguere, D.; Inguimbert, C.; Deneau, C.; Vaillé , J.-R.; Lorfè vre, E.; Ecoffet, R.

Publisher: IEEE

Year: 2014

In-Flight Measurements of Radiation Environment on Board the Argentinean Satellite SAC-D

Type: Journal Paper

Author : Boscher, D.; Cayton, T.; Maget, V.; Bourdarie, S.; Lazaro, D.; Baldran, T.; Bourdoux, P.; Lorfevre, E.; Rolland, G.; Ecoffet, R.

Publisher: IEEE

Year: 2014

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Type: Journal Paper

Author : Privat, A.; Touboul, A.D.; Michez, A.; Bourdarie, S.; Vaille, J.R.; Wrobel, F.; Chatry, N.; Chaumont, G.; Lorfevre, E.; Bezerra, F.; Saigne, F.

Publisher: IEEE

Year: 2014

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

Type: Journal Paper

Author : Privat, A.; Touboul, A.D.; Petit, Marc; Huselstein, J.J.; Wrobel, F.; Forest, Francois; Vaillé , J.R.; Bourdarie, S.; Arinero, R.; Chatry, N.; Chaumont, G.; Lorfè vre, E.; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

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In-depth Analysis of SREM Count Rate Measurements for Future Use in EnKF Salammbô Data Assimilation Tool

A New ONERA-CNES Slot Electron Model

Radiation Belt Activity Indices and Solar Proton Event Alarm

Unfolding JASON-2/ICARE-NG High-Energy Particles Measurements Using a Singular Value Decomposition Approach

Correlation of In-Flight Displacement Damage on the OSL Sensor With Space Environment On-Board Jason-2 Spacecraft

In-Flight Measurements of Radiation Environment on Board the Argentinean Satellite SAC-D

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

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In-depth Analysis of SREM Count Rate Measurements for Future Use in EnKF Salammb&#x00F4; Data Assimilation Tool

A New ONERA-CNES Slot Electron Model

Radiation Belt Activity Indices and Solar Proton Event Alarm

Unfolding JASON-2/ICARE-NG High-Energy Particles Measurements Using a Singular Value Decomposition Approach

Correlation of In-Flight Displacement Damage on the OSL Sensor With Space Environment On-Board Jason-2 Spacecraft

In-Flight Measurements of Radiation Environment on Board the Argentinean Satellite SAC-D

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

In-depth Analysis of SREM Count Rate Measurements for Future Use in EnKF Salammbô Data Assimilation Tool