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Determination of the complex permittivity of packaging materials at millimeter-wave frequencies

Type: Journal Paper

Author : Zwick, T.; Chandrasekhar, A.; Baks, C.W.; Pfeiffer, U.R.; Brebels, S.; Gaucher, B.P.

Year: 2006

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Proximity effects between striplines and vias

Type: Conference Paper

Author : Kwark, Y.H.; Rimolo-Donadio, R.; Baks, C.W.; Muller, S.; Schuster, C.

Publisher: IEEE

Year: 2014

Monolithic Silicon Integration of Scaled Photonic Switch Fabrics, CMOS Logic, and Device Driver Circuits

Type: Journal Paper

Author : Lee, Byeong; Rylyakov, A.V.; Green, William M. J.; Assefa, Solomon; Baks, C.W.; Rimolo-Donadio, Renato; Kuchta, D.M.; Khater, Marwan H.; Barwicz, Tymon; Reinholm, Carol; Kiewra, Edward; Shank, Steven M.; Schow, C.L.; Vlasov, Yurii /A/.

Publisher: IEEE

Year: 2014

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Determination of the complex permittivity of packaging materials at millimeter-wave frequencies

Proximity effects between striplines and vias

Monolithic Silicon Integration of Scaled Photonic Switch Fabrics, CMOS Logic, and Device Driver Circuits

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Determination of the complex permittivity of packaging materials at millimeter-wave frequencies

Proximity effects between striplines and vias

Monolithic Silicon Integration of Scaled Photonic Switch Fabrics, CMOS Logic, and Device Driver Circuits