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Modeling and Simulation of Single-Event Effects in Digital Devices and ICs

Type: Journal Paper

Author : Munteanu, D.; Autran, J.-L.

Year: 2008

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Random-Walk Drift-Diffusion Charge-Collection Model For Reverse-Biased Junctions Embedded in Circuits

Type: Journal Paper

Author : Glorieux, M.; Autran, J.L.; Munteanu, Daniela; Clerc, Sylvain; Gasiot, Gilles; Roche, Philippe

Publisher: IEEE

Year: 2014

Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation

Type: Journal Paper

Author : Roche, Philippe; Gasiot, Gilles; Autran, J.L.; Munteanu, Daniela; Reed, R.A.; Weller, Robert /A/.

Publisher: IEEE

Year: 2014

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Type: Journal Paper

Author : Saoud, T. Saad; Moindjie, S.; Autran, J.L.; Munteanu, Daniela; Wrobel, F.; Saigne, F.; Cocquerez, P.; Dilillo, L.; Glorieux, M.

Publisher: IEEE

Year: 2014

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; Cocquerez, P.; Autran, J.L.; Litterio, A.; Wrobel, F.; Saigne, F.

Publisher: IEEE

Year: 2014

An Analytical Model to Quantify Decay Chain Disequilibrium–Application to the Thorium Decay Chain

Type: Journal Paper

Author : Kaouache, A.; Wrobel, F.; Saigné , Fré dé ric; Touboul, A.D.; Schrimpf, R.D.; Autran, J.L.

Publisher: IEEE

Year: 2014

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Modeling and Simulation of Single-Event Effects in Digital Devices and ICs

Random-Walk Drift-Diffusion Charge-Collection Model For Reverse-Biased Junctions Embedded in Circuits

Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

An Analytical Model to Quantify Decay Chain Disequilibrium–Application to the Thorium Decay Chain

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Modeling and Simulation of Single-Event Effects in Digital Devices and ICs

Random-Walk Drift-Diffusion Charge-Collection Model For Reverse-Biased Junctions Embedded in Circuits

Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

90&#x00A0;nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

An Analytical Model to Quantify Decay Chain Disequilibrium&#x2013;Application to the Thorium Decay Chain

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

An Analytical Model to Quantify Decay Chain Disequilibrium–Application to the Thorium Decay Chain