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Characterization of nanocrystal-ink based CZTSSe and CIGSSe solar cells using voltage-dependent admittance spectroscopy

Type: Conference Paper

Author : Xingshu Sun; Hages, C.J.; Carter, N.J.; Moore, J.E.; Agrawal, R.; Lundstrom, M.

Publisher: IEEE

Year: 2014

On the Sum of L1 Influences

Type: Conference Paper

Author : Backurs, A. , Bavarian, M.

Publisher: IEEE

Year: 2014

Software Measurement in the Netherlands - The 25th Anniversary of Nesma

Type: Conference Paper

Author : Board, Nesma

Publisher: IEEE

Year: 2014

Dynamic interference shaping method for video applications in dense deployment wireless networks

Type: Conference Paper

Author : Zhou, Shiyu; Lu, Zhaoming; Wen, Xiangming; Shao, Hua; Li, Yangchun; Chen, Yawen

Publisher: IEEE

Year: 2014

Author

Agrawal, R. (1)

Backurs, A. , Bavarian, M. (1)

Board, Nesma (1)

Carter, N.J. (1)

Chen, Yawen (1)

Hages, C.J. (1)

Li, Yangchun (1)

Lu, Zhaoming (1)

Lundstrom, M. (1)

Moore, J.E. (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

MOSFET (3)

DC-DC power convertors (2)

Logic gates (2)

Switches (2)

buffer blocks (1)

Capacitors (1)

control logic (1)

dc-dc converter (1)

dead-time (1)

dynamic load conditions (1)

Type

Conference Paper (4)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

hotovoltaic Specialist Conference (PVSC), 2014 IEEE 40th (1)

ireless Personal Multimedia Communications (WPMC), 2014 International Symposium on (1)

oftware Measurement and the International Conference on Software Process and Product Measurement (IW (1)

omputational Complexity (CCC), 2014 IEEE 29th Conference on (1)

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