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    Photon-Counting Security Tagging and Verification Using Optically Encoded QR Codes 

    Type: Journal Paper
    Author : Markman, A.; Javidi, Bahram; Tehranipoor, Mohammad
    Publisher: IEEE
    Year: 2014

    Monitoring of continuous crystallization process 

    Type: Conference Paper
    Author : Aparna, A M; Kundu, Madhusree
    Publisher: IEEE
    Year: 2014

    EV charging stations and modes: International standards 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Improving the bond strength of sinter joints by modifying the DBC without noble finishes and modified silver sinter pastes 

    Type: Conference Paper
    Author : Roth, Alexander , Schmitt, Wolfgang
    Publisher: IEEE
    Year: 2014

    AusPlots Rangelands Field Data Collection and Publication: Infrastructure for Ecological Monitoring 

    Type: Conference Paper
    Author : Tokmakoff, Andrew; Sparrow, Ben; Turner, David; Lowe, Andrew
    Publisher: IEEE
    Year: 2014

    Computer simulation of nanodot Mfm-images 

    Type: Conference Paper
    Author : Nefedev, K.V. , Kudrina, E.A.
    Publisher: IEEE
    Year: 2014

    Determination of Local Slope on the Greenland Ice Sheet Using a Multibeam Photon-Counting Lidar in Preparation for the ICESat-2 Mission 

    Type: Journal Paper
    Author : Brunt, Kelly M.; Neumann, Thomas /A/.; Walsh, Kaitlin M.; Markus, Thorsten
    Publisher: IEEE
    Year: 2014

    Theoretical Comparison of the Iodine Quantification Accuracy of Two Spectral CT Technologies 

    Type: Journal Paper
    Author : Bornefalk, Hans; Persson, Mats
    Publisher: IEEE
    Year: 2014

    Tensor-Based Formulation and Nuclear Norm Regularization for Multienergy Computed Tomography 

    Type: Journal Paper
    Author : Semerci, Oguz; Ning Hao; Kilmer, Misha E.; Miller, Eric L.
    Publisher: IEEE
    Year: 2014

    Location spoofing attack and its countermeasures in database-driven cognitive radio networks 

    Type: Conference Paper
    Author : Zeng, Kexiong; Kondaji Ramesh, Sreeraksha; Yang, Yaling
    Publisher: IEEE
    Year: 2014
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