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Inverse Scaling Trends for Charge-Trapping-Induced Degradation of FinFETs Performance

Type: Journal Paper

Author : Amoroso, S.M.; Georgiev, V.P.; Gerrer, L.; Towie, E.; Xingsheng Wang; Riddet, C.; Brown, A.R.; Asenov, A.

Publisher: IEEE

Year: 2014

Benchmarking Transition Metal Dichalcogenide MOSFET in the Ultimate Physical Scaling Limit

Type: Journal Paper

Author : Majumdar, K.; Hobbs, Chris; Kirsch, P.D.

Publisher: IEEE

Year: 2014

A decision-making support system oriented to the simulation & evaluation of the emergency response effectiveness

Type: Conference Paper

Author : Huang Yanyan , Shi Weifeng , Wei Lai

Publisher: IEEE

Year: 2014

Secure and QoS-Managed Information Exchange Between Enterprise and Constrained Environments

Type: Conference Paper

Publisher: IEEE

Year: 2014

Revisiting the Slepian-Wolf coding problem for general sources: A direct approach

Type: Conference Paper

Author : Uyematsu, T. , Matsuta, T.

Publisher: IEEE

Year: 2014

GaSb-InAs n-TFET With Doped Source Underlap Exhibiting Low Subthreshold Swing at Sub-10-nm Gate-Lengths

Type: Journal Paper

Author : Sharma, Ashok; Goud, Akkala Arun; Roy, Kaushik

Publisher: IEEE

Year: 2014

Effect of Random, Discrete Source Dopant Distributions on Nanowire Tunnel FETs

Type: Journal Paper

Author : Sylvia, Somaia Sarwat; Habib, K. M. Masum; Khayer, M. Abul; Alam, Khairul; Neupane, Mahesh; Lake, Roger K.

Publisher: IEEE

Year: 2014

Current Switching in Graphene Quantum Point Contacts

Type: Journal Paper

Author : Karafyllidis, Ioannis

Publisher: IEEE

Year: 2014

Spatial multiplexing for multiple users exceeding degree of freedom by successive interference cancellation and zero forcing

Type: Conference Paper

Author : Keita, Nakagawa; Nishimori, Kentaro; Sasaki, Satoshi; Makino, Hideo

Publisher: IEEE

Year: 2014

Two-Dimensional Tunnel Transistors Based on <formula formulatype="inline"> <img src="/images/tex/21283.gif" alt="{\\rm Bi}_{2}{\\rm Se}_{3}"> </formula> Thin Film

Type: Journal Paper

Author : Qin Zhang; Iannaccone, Giuseppe; Fiori, G.

Publisher: IEEE

Year: 2014

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Inverse Scaling Trends for Charge-Trapping-Induced Degradation of FinFETs Performance

Benchmarking Transition Metal Dichalcogenide MOSFET in the Ultimate Physical Scaling Limit

A decision-making support system oriented to the simulation & evaluation of the emergency response effectiveness

Secure and QoS-Managed Information Exchange Between Enterprise and Constrained Environments

Revisiting the Slepian-Wolf coding problem for general sources: A direct approach

GaSb-InAs n-TFET With Doped Source Underlap Exhibiting Low Subthreshold Swing at Sub-10-nm Gate-Lengths

Effect of Random, Discrete Source Dopant Distributions on Nanowire Tunnel FETs

Current Switching in Graphene Quantum Point Contacts

Spatial multiplexing for multiple users exceeding degree of freedom by successive interference cancellation and zero forcing

Two-Dimensional Tunnel Transistors Based on <formula formulatype="inline"> <img src="/images/tex/21283.gif" alt="{\\rm Bi}_{2}{\\rm Se}_{3}"> </formula> Thin Film

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Inverse Scaling Trends for Charge-Trapping-Induced Degradation of FinFETs Performance

Benchmarking Transition Metal Dichalcogenide MOSFET in the Ultimate Physical Scaling Limit

A decision-making support system oriented to the simulation &amp; evaluation of the emergency response effectiveness

Secure and QoS-Managed Information Exchange Between Enterprise and Constrained Environments

Revisiting the Slepian-Wolf coding problem for general sources: A direct approach

GaSb-InAs n-TFET With Doped Source Underlap Exhibiting Low Subthreshold Swing at Sub-10-nm Gate-Lengths

Effect of Random, Discrete Source Dopant Distributions on Nanowire Tunnel FETs

Current Switching in Graphene Quantum Point Contacts

Spatial multiplexing for multiple users exceeding degree of freedom by successive interference cancellation and zero forcing

Two-Dimensional Tunnel Transistors Based on <formula formulatype="inline"> <img src="/images/tex/21283.gif" alt="{\\rm Bi}_{2}{\\rm Se}_{3}"> </formula> Thin Film

A decision-making support system oriented to the simulation & evaluation of the emergency response effectiveness