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    Hardware-software complex of interferencing situation control and localization of electromagnetic radiation sources 

    Type: Conference Paper
    Author : Bobrikhin, A.F.; Gudkov, A.G.; Leushin, V.Yu.; Meshkov, S.A.; Kolpakov, N.S.; Porokhov, I.O.; Silkin, A.T.
    Publisher: IEEE
    Year: 2014

    SDF: A Sign Description Framework for Cross-Context Information Resource Representation and Interchange 

    Type: Conference Paper
    Author : Jingzhi Guo
    Publisher: IEEE
    Year: 2014

    Transformer high frequency modelling based on lumped parameter model by consideration of corelosses 

    Type: Conference Paper
    Author : Zeinali, Reza; Ghanizadeh, Ahmad Javid; Asl, Rasul Tarvirdilu; Gharehpetian, Gevorg B.
    Publisher: IEEE
    Year: 2014

    A W-band gyrotron traveling wave amplifier experiment 

    Type: Conference Paper
    Author : He, W.; Donaldson, C.R.; Zhang, L.; McElhinney, P.; Phelps, A.D.R.; Ronald, K.; Cross, A.W.
    Publisher: IEEE
    Year: 2014

    Measurement and Interpretation of Micro-benchmark and Application Energy Use on the Cray XC30 

    Type: Conference Paper
    Author : Austin, B.; Wright, N.J.
    Publisher: IEEE
    Year: 2014

    Joint Sentiment/Topic extraction from text 

    Type: Conference Paper
    Author : Sowmiya, J.S.; Chandrakala, S.
    Publisher: IEEE
    Year: 2014

    Stability boundary on P-V plane for analysis of short-term voltage stability 

    Type: Conference Paper
    Author : Kawabe, Kenichi; Tanaka, Kazuyuki
    Publisher: IEEE
    Year: 2014

    A Novel Prediction Method for Analog Circuits Based on Gaussian White Noise Estimation 

    Type: Conference Paper
    Author : Zhou, Jingyu; Tian, Shulin; Long, Bing; Yang, Chenglin
    Publisher: IEEE
    Year: 2014

    Parallel implementation of eigenface on CUDA 

    Type: Conference Paper
    Author : Kawale, M.R.; Bhadke, Y.; Inamdar, V.
    Publisher: IEEE
    Year: 2014

    Reliability investigations of large die wafer level packages: Optimization of package structure and materials to improve board level reliability 

    Type: Conference Paper
    Author : Jarn, Markus; Hsieh, Chueh-An; Pai, Yu-Chi; Wang, Tsaiying; Hunt, John
    Publisher: IEEE
    Year: 2014
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