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    Publisher's Information 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Micro-Raman characterization of graphene grown on SiC(000-1) 

    Type: Conference Paper
    Author : Piazza, A.; Agnello, S.; Deretzis, I.; La Magna, A.; Scuderi, M.; Nicotra, G.; Spinella, C.; Fisichella, G.; Roccaforte, F.; Cannas, M.; Gelardi, F.M.; Yakimova, R.; Giannazzo, F.
    Publisher: IEEE
    Year: 2014

    High performance integrated inductors for power management applications 

    Type: Conference Paper
    Author : Eshkoli, Ayal; Bar-Lev, Sharon; Peled, Gabi; Nemirovsky, Yael; Parag, Allon; Shapira, Shye
    Publisher: IEEE
    Year: 2014

    An anticipated multi-contingencies selection method based on fault influence domain 

    Type: Conference Paper
    Author : Zhang, Yi; Li, Chuandong; Yang, Guizhong; Zhu, Hongbo
    Publisher: IEEE
    Year: 2014

    Broadband terahertz reflective linear polarization convertor 

    Type: Conference Paper
    Author : Cheng, Yong Zhi; Withayachumnankul, Withawat; Upadhyay, Aditi; Headland, Daniel; Nie, Yan; Gong, Rong Zhou; Bhaskaran, Madhu; Sriram, Sharath; Abbott, Derek
    Publisher: IEEE
    Year: 2014

    [Front cover] 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Weber local descriptor from three orthogonal planes based video copy detection 

    Type: Conference Paper
    Author : Boukhari, A.; Serir, A.
    Publisher: IEEE
    Year: 2014

    Automatic Generation Algorithm of Penetration Graph in Penetration Testing 

    Type: Conference Paper
    Author : Xueqiu; Jia, Qiong; Wang, Shuguang; Xia, Chunhe; Lv, Liangshuang
    Publisher: IEEE
    Year: 2014

    Single & multi beam laser grooving process parameter development and die strength characterization for 40nm node low-K/ULK wafer 

    Type: Conference Paper
    Author : Shi, Koh Wen; Yow, K.Y.; Lo, Calvin
    Publisher: IEEE
    Year: 2014

    Learning Analytics in Linked Open Online Courses 

    Type: Conference Paper
    Author : Hover, Kai Michael; Muhlhauser, Max
    Publisher: IEEE
    Year: 2014
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