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Understanding operational and charging patterns of Electric Vehicle taxis using GPS records

Type: Conference Paper

Author : Zhiyong Tian; Yi Wang; Chen Tian; Fan Zhang; Lai Tu; Chengzhong Xu

Publisher: IEEE

Year: 2014

Collaborative detection of common lines in cryo EM images using maximum likelihood

Type: Conference Paper

Author : Cohen, Mor; Shkolnisky, Yoel; Yeredor, Arie

Publisher: IEEE

Year: 2014

Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies

Type: Conference Paper

Author : Bao, T.H.; Yakimets, D.; Ryckaert, J.; Ciofi, I.; Baert, R.; Veloso, A.; Boemmels, J.; Collaert, N.; Roussel, P.; Demuynck, S.; Raghavan, P.; Mercha, A.; Tokei, Z.; Verkest, D.; Thean, A.V.-Y.; Wambacq, P.

Publisher: IEEE

Year: 2014

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Understanding operational and charging patterns of Electric Vehicle taxis using GPS records

Collaborative detection of common lines in cryo EM images using maximum likelihood

Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies

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Understanding operational and charging patterns of Electric Vehicle taxis using GPS records

Collaborative detection of common lines in cryo EM images using maximum likelihood

Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies