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Learning visual saliency using topographic independent component analysis

Type: Conference Paper

Author : Stefic, Daria; Patras, Ioannis

Publisher: IEEE

Year: 2014

The simulation of the viscous fluid splitting at the outlet of the engagement zone between cylinder surfaces and substrate

Type: Conference Paper

Author : Panichkin, Alekxey V.; Varepo, Larisa G.

Publisher: IEEE

Year: 2014

A risk assessment tool for advanced metering infrastructures

Type: Conference Paper

Author : Shawly, Tawfeeq; Liu, Jun; Burow, Nathan; Bagchi, Saurabh; Berthier, Robin; Bobba, Rakesh B.

Publisher: IEEE

Year: 2014

The creation of pressure maps using SIF/IFF information

Type: Conference Paper

Author : Gregor, Ladislav; Drazan, Libor; Vesely, Jiri

Publisher: IEEE

Year: 2014

Fast iteratively reweighted least squares for l<inf>p</inf> regularized image deconvolution and reconstruction

Type: Conference Paper

Author : Zhou, Xu; Molina, Rafael; Zhou, Fugen; Katsaggelos, Aggelos K.

Publisher: IEEE

Year: 2014

Nanosecond accuracy using SoC platforms

Type: Conference Paper

Author : Moreira, N.; Lazaro, J.; Astarloa, A.; Garcia, A.; Salas, S.

Publisher: IEEE

Year: 2014

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Learning visual saliency using topographic independent component analysis

The simulation of the viscous fluid splitting at the outlet of the engagement zone between cylinder surfaces and substrate

A risk assessment tool for advanced metering infrastructures

The creation of pressure maps using SIF/IFF information

Fast iteratively reweighted least squares for l<inf>p</inf> regularized image deconvolution and reconstruction

Nanosecond accuracy using SoC platforms

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Learning visual saliency using topographic independent component analysis

The simulation of the viscous fluid splitting at the outlet of the engagement zone between cylinder surfaces and substrate

A risk assessment tool for advanced metering infrastructures

The creation of pressure maps using SIF/IFF information

Fast iteratively reweighted least squares for l<inf>p</inf> regularized image deconvolution and reconstruction

Nanosecond accuracy using SoC platforms