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    Random patterns of secret keys from sampled IR-UWB channel responses 

    Type: Conference Paper
    Author : Tunaru, Iulia; Denis, Benoit; Uguen, Bernard
    Publisher: IEEE
    Year: 2014

    Predictive simulation of future CMOS technologies and their impact on circuits 

    Type: Conference Paper
    Author : Asenov, A.; Cheng, B.; Adamu-Lema, F.; Shifren, L.; Sinha, S.; Riddet, C.; Alexander, C.; Brown, A.R.; Wang, X.; Amoroso, S.M.
    Publisher: IEEE
    Year: 2014

    Effects of inner volume on UWB propagation channels within closed spaces 

    Type: Conference Paper
    Author : Hirose, Miyuki; Kobayashi, Takehiko; Tomiki, Atsushi; Toda, Tomoaki
    Publisher: IEEE
    Year: 2014

    2D/3D AudioVisual content analysis & description 

    Type: Conference Paper
    Author : Pitas, I.; Papachristou, K.; Nikolaidis, N.; Liuni, M.; Benaroya, L.; Peeters, G.; Roebel, A.; Linnemann, A.; Liu, M.; Gerke, S.
    Publisher: IEEE
    Year: 2014

    Data mining by nonnegative tensor approximation 

    Type: Conference Paper
    Author : Farias, Rodrigo Cabral; Comon, Pierre; Redon, Roland
    Publisher: IEEE
    Year: 2014

    Maximum reconstruction probability training of Restricted Boltzmann machines with auxiliary function approach 

    Type: Conference Paper
    Author : Takamune, Norihiro; Kameoka, Hirokazu
    Publisher: IEEE
    Year: 2014

    PDF Not Yet Available In IEEE Xplore 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Application of STATCOM-HTS to improve DFIG performance and FRT during IGBT short circuit 

    Type: Conference Paper
    Author : Abdou, A.F.; Pota, H.R.; Abu-Siada, A.; Alharbi, Yasser M.
    Publisher: IEEE
    Year: 2014

    Improving performance for a <sup>13</sup>C isotope separation plant using multivariable fractional order controllers 

    Type: Conference Paper
    Author : Muresan, Cristina I.; Dulf, Eva H.; Ionescu, Clara M.; Both, Roxana; Nascu, Ioan
    Publisher: IEEE
    Year: 2014

    Table of contents 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014
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