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    Author index 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Recent advances and future trends in SOI for RF applications 

    Type: Conference Paper
    Author : Joshi, Aniruddha; Lee, Tzung-yin; Chen, Yuh-yue; Whitefield, David
    Publisher: IEEE
    Year: 2014

    Residual error analysis of a calibrated vector network analyzer 

    Type: Conference Paper
    Author : Mubarak, F.; Rietveld, G.
    Publisher: IEEE
    Year: 2014

    BPSK Costas loop: Simulation of nonlinear models in MatLab Simulink 

    Type: Conference Paper
    Author : Kuznetsov, N.V.; Kuznetsova, O.A.; Leonov, G.A.; Seledzhi, S.M.; Yuldashev, M.V.; Yuldashev, R.V.
    Publisher: IEEE
    Year: 2014

    PV ramp limiting controls with adaptive smoothing filter through a battery energy storage system 

    Type: Conference Paper
    Author : Lam, R.K.; Hen-Geul Yeh
    Publisher: IEEE
    Year: 2014

    Analytical Modeling for reliability in cluster based Wireless Sensor Networks 

    Type: Conference Paper
    Author : Ahmed, Alaa Eldeen Sayed
    Publisher: IEEE
    Year: 2014

    Coupling power and frequency adaptation for interference mitigation in IEEE 802.15.4-based mobile body sensor networks: Part II 

    Type: Conference Paper
    Author : Yazdi, E.T.; Moravejosharieh, A.; Willig, A.; Pawlikowski, K.
    Publisher: IEEE
    Year: 2014

    Automating the Design of Processor/Accelerator Embedded Systems with LegUp High-Level Synthesis 

    Type: Conference Paper
    Author : Fort, Blair; Canis, Andrew; Choi, Jongsok; Calagar, Nazanin; Lian, Ruolong; Hadjis, Stefan; Chen, Yu Ting; Hall, Mathew; Syrowik, Bain; Czajkowski, Tomasz; Brown, Stephen; Anderson, Jason
    Publisher: IEEE
    Year: 2014

    The integration of current instrument transformers, with optic transmitting of information, into actual measuring systems 

    Type: Conference Paper
    Author : Popescu, Marinel; Mihalcea, Ilie; Popa, Teodor
    Publisher: IEEE
    Year: 2014

    A comparison of donor mapping techniques using the scanning helium ion microscope and scanning electron microscope 

    Type: Conference Paper
    Author : Chee, A.
    Publisher: IEEE
    Year: 2014
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