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نمایش تعداد 1-10 از 38
WaFeR — A framework for testing Ul-based applications
ناشر: IEEE
سال: 2014
VLSI design and comparative analysis of memory BIST controllers
ناشر: IEEE
سال: 2014
High temperature performance of flexible SOI FinFETs with sub-20 nm fins
ناشر: IEEE
سال: 2014
Info-greedy sequential adaptive compressed sensing
ناشر: IEEE
سال: 2014
CORDIC based BPSK modulator
ناشر: IEEE
سال: 2014