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Integrated modeling for gas mixing process based on mechanism and subspace identification

Type: Conference Paper

Publisher: IEEE

Year: 2014

Analysis of Stability Degradation of SRAMs Using a Physics-Based PBTI Model

Type: Journal Paper

Author : Chih-Hsiang Ho; Hassan, Mohammad Kamrul; Soo Youn Kim; Roy, Kaushik

Publisher: IEEE

Year: 2014

Author

Chih-Hsiang Ho (1)

Hassan, Mohammad Kamrul (1)

Roy, Kaushik (1)

Soo Youn Kim (1)

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IEEE (2)

Year

2014 (2)

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6T-SRAM cell (1)

Databases (1)

Degradation (1)

design parameters (1)

Dictionaries (1)

high-k dielectric thin films (1)

high-k-metal gate transistors (1)

induced read failure rate (1)

integrated circuit design (1)

intrinsic variation (1)

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Conference Paper (1)

Journal Paper (1)

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English (2)

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Metadata Only (2)

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Electron Device Letters, IEEE (1)

ontrol and Decision Conference (2014 CCDC), The 26th Chinese (1)

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