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Monitoring Quality Characteristics Using Linear Profile

نوع: Conference Paper

نویسنده : , Noorosana; , Amiri; , Vaghefi; , Roghanian

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Monitoring Quality Characteristics Using Linear Profile

نوع: Conference Paper

نویسنده : Noorosana, Amiri, Vaghefi, Roghanian

Plasmonic switches

نوع: Conference Paper

ناشر: IEEE

سال: 2014

On-the-Fly Massively Multitemporal Change Detection Using Statistical Quality Control Charts and Landsat Data

نوع: Journal Paper

نویسنده : Brooks, Evan B.; Wynne, Randolph H.; Thomas, Varghese; Blinn, Christine E.; Coulston, John W.

ناشر: IEEE

سال: 2014

Improving MapReduce Performance Using Smart Speculative Execution Strategy

نوع: Journal Paper

نویسنده : Qi Chen; Cheng Liu; Zhen Xiao

ناشر: IEEE

سال: 2014

Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller

نوع: Journal Paper

نویسنده : Chen-Fu Chien; Ying-Jen Chen; Chia-Yu Hsu; Hung-Kai Wang

ناشر: IEEE

سال: 2014

Takagi–Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products

نوع: Journal Paper

نویسنده : Ying Zheng; Wong, David Shan-Hill; Yan-Wei Wang; Huajing Fang

ناشر: IEEE

سال: 2014

Robustness Analysis of Mixed Product Run-to-Run Control for Semiconductor Process Based on ODOB Control Structure

نوع: Journal Paper

نویسنده : An-Chen Lee; Jeng-Haur Horng; Tzu-Wei Kuo; Nan-Hung Chou

ناشر: IEEE

سال: 2014

Edge based directional features for English-Bengali script recognition

نوع: Conference Paper

نویسنده : Tikader, A. , Puhan, N.B.

ناشر: IEEE

سال: 2014

Temperature measurement of power electronics devices based on SAW sensors

نوع: Conference Paper

نویسنده : Blaszczyk, Pawel; Wojcik, Mariusz; Baszynski, Michal

ناشر: IEEE

سال: 2014

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Monitoring Quality Characteristics Using Linear Profile

Monitoring Quality Characteristics Using Linear Profile

Plasmonic switches

On-the-Fly Massively Multitemporal Change Detection Using Statistical Quality Control Charts and Landsat Data

Improving MapReduce Performance Using Smart Speculative Execution Strategy

Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller

Takagi–Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products

Robustness Analysis of Mixed Product Run-to-Run Control for Semiconductor Process Based on ODOB Control Structure

Edge based directional features for English-Bengali script recognition

Temperature measurement of power electronics devices based on SAW sensors

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Monitoring Quality Characteristics Using Linear Profile

Monitoring Quality Characteristics Using Linear Profile

Plasmonic switches

On-the-Fly Massively Multitemporal Change Detection Using Statistical Quality Control Charts and Landsat Data

Improving MapReduce Performance Using Smart Speculative Execution Strategy

Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller

Takagi&#x2013;Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products

Robustness Analysis of Mixed Product Run-to-Run Control for Semiconductor Process Based on ODOB Control Structure

Edge based directional features for English-Bengali script recognition

Temperature measurement of power electronics devices based on SAW sensors

Takagi–Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products