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Now showing items 1-9 of 9

Study of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes

Type: Journal Paper

Author : Sun, Wen; Zheng, Xiaoquan; Campbell, Joe C.

Publisher: IEEE

Year: 2014

A Theory of Multiplication Noise for Electron Multiplying CMOS Image Sensors

Type: Journal Paper

Author : Brugiè re, Timothé e; Mayer, Felix; Fereyre, Pierre; Dominjon, Agnes; Barbier, Remi

Publisher: IEEE

Year: 2014

Energy Resolution Contributions in Reach-Through Avalanche Photodiodes

Type: Journal Paper

Author : Gouvea, A.L.; Fernandes, L.M.P.

Publisher: IEEE

Year: 2014

Optical-Power Dependence of Gain, Noise, and Bandwidth Characteristics for 850-nm CMOS Silicon Avalanche Photodetectors

Type: Journal Paper

Author : Myung-Jae Lee; Rü cker, Holger; Woo-Young Choi

Publisher: IEEE

Year: 2014

Noise Equivalent Circuit Model of Thin Avalanche Photodiodes

Type: Journal Paper

Author : Akbari, Mohammad Hossein; Jalali, Mohammad

Publisher: IEEE

Year: 2014

An Intuitive Analysis of Phase Noise Fundamental Limits Suitable for Benchmarking LC Oscillators

Type: Journal Paper

Author : Garampazzi, Marco; Dal Toso, Stefano; Liscidini, Antonio; Manstretta, Danilo; Mendez, Pablo; Romano, Lucia; Castello, Rinaldo

Publisher: IEEE

Year: 2014

EmoMeter: Measuring mixed emotions using weighted combinational model

Type: Conference Paper

Author : Ananda Kanagaraj S; Shahina A; Devosh M; Kamalakannan N

Publisher: IEEE

Year: 2014

Linear- and Geiger-Mode Characteristics of Al<sub>0.8</sub>Ga<sub>0.2</sub>As Avalanche Photodiodes

Type: Journal Paper

Author : Min Ren; Yaojia Chen; Wenlu Sun; Xiao Jie Chen; Johnson, Erik B.; Christian, James F.; Campbell, Joe C.

Publisher: IEEE

Year: 2014

Determination of Quantum Efficiency in In<inline-formula> <img src="/images/tex/21810.gif" alt="_{\\bf {0.53}}"> </inline-formula>Ga<inline-formula> <img src="/images/tex/21811.gif" alt="_{\\bf{0.47}}"> </inline-formula>As-InP-Based APDs

Type: Journal Paper

Author : Clark, William R.; Vaccaro, Ken; Waters, William D.; Gribbon, Celine L.; Krejca, Brian D.

Publisher: IEEE

Year: 2014

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Study of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes

A Theory of Multiplication Noise for Electron Multiplying CMOS Image Sensors

Energy Resolution Contributions in Reach-Through Avalanche Photodiodes

Optical-Power Dependence of Gain, Noise, and Bandwidth Characteristics for 850-nm CMOS Silicon Avalanche Photodetectors

Noise Equivalent Circuit Model of Thin Avalanche Photodiodes

An Intuitive Analysis of Phase Noise Fundamental Limits Suitable for Benchmarking LC Oscillators

EmoMeter: Measuring mixed emotions using weighted combinational model

Linear- and Geiger-Mode Characteristics of Al<sub>0.8</sub>Ga<sub>0.2</sub>As Avalanche Photodiodes

Determination of Quantum Efficiency in In<inline-formula> <img src="/images/tex/21810.gif" alt="_{\\bf {0.53}}"> </inline-formula>Ga<inline-formula> <img src="/images/tex/21811.gif" alt="_{\\bf{0.47}}"> </inline-formula>As-InP-Based APDs

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Study of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes

A Theory of Multiplication Noise for Electron Multiplying CMOS Image Sensors

Energy Resolution Contributions in Reach-Through Avalanche Photodiodes

Optical-Power Dependence of Gain, Noise, and Bandwidth Characteristics for 850-nm CMOS Silicon Avalanche Photodetectors

Noise Equivalent Circuit Model of Thin Avalanche Photodiodes

An Intuitive Analysis of Phase Noise Fundamental Limits Suitable for Benchmarking LC Oscillators

EmoMeter: Measuring mixed emotions using weighted combinational model

Linear- and Geiger-Mode Characteristics of Al<sub>0.8</sub>Ga<sub>0.2</sub>As Avalanche Photodiodes

Determination of Quantum Efficiency in In<inline-formula> <img src="/images/tex/21810.gif" alt="_{\\bf {0.53}}"> </inline-formula>Ga<inline-formula> <img src="/images/tex/21811.gif" alt="_{\\bf{0.47}}"> </inline-formula>As-InP-Based APDs