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Displacement Sensing by Repetition Rate Pulling in a Passively Mode Locked Laser Under Feedback

Type: Journal Paper

Author : Simos, Christos; Simos, Hercules; Nikas, Thomas; Syvridis, Dimitris

Publisher: IEEE

Year: 2014

Atomic Resolution Disk Resonant Force and Displacement Sensors for Measurements in Liquid

Type: Journal Paper

Author : Mehdizadeh, Emad; Rostami, Mohamad; Xiaobo Guo; Pourkamali, Siavash

Publisher: IEEE

Year: 2014

Author

Mehdizadeh, Emad (1)

Nikas, Thomas (1)

Pourkamali, Siavash (1)

Rostami, Mohamad (1)

Simos, Christos (1)

Simos, Hercules (1)

Syvridis, Dimitris (1)

Xiaobo Guo (1)

Publisher

IEEE (2)

Year

2014 (2)

Keywords

displacement measurement (2)

atomic force microscopy (1)

atomic level force measurement (1)

atomic resolution disk resonant displacement sensor (1)

atomic resolution disk resonant force sensor (1)

Cav (1)

displacement resolution (1)

electrostatic actuators (1)

external cavity (1)

flexible extensional mode resonant microstructure (1)

Type

Journal Paper (2)

Language (ISO)

English (2)

Content Type

Metadata Only (2)

Publication Title

Electron Device Letters, IEEE (1)

Photonics Technology Letters, IEEE (1)

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