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نمایش تعداد 1-10 از 12
NDC: Analyzing the impact of 3D-stacked memory+logic devices on MapReduce workloads
ناشر: IEEE
سال: 2014
Optimal Test Current Shape for Accurate Arc Characteristic Determination
ناشر: IEEE
سال: 2014
The optimization of undervoltage load shedding strategy
ناشر: IEEE
سال: 2014