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    Single Event Hard Errors in SRAM Under Heavy Ion Irradiation 

    Type: Journal Paper
    Author : Haran, Avner; Barak, Joseph; David, David; Keren, Eitan; Refaeli, Nati; Rapaport, Shimshon
    Publisher: IEEE
    Year: 2014

    Field Dependence of Charge Yield in Silicon Dioxide 

    Type: Journal Paper
    Author : Johnston, A.H.; Swimm, R.T.; Thorbourn, D.O.; Adell, P.C.; Rax, B.G.
    Publisher: IEEE
    Year: 2014

    Optimized GAF in Wireless Sensor Network 

    Type: Conference Paper
    Author : Grover, J.; Shikha; Sharma, M.
    Publisher: IEEE
    Year: 2014

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