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RISFrequency Analysis of Atomic Force Microscopy Cantilevers in a Dynamic Mode Considering Tip Mass and Moment of Inertia
سال: 2006
خلاصه:
In this paper, the high frequency analysis of a non-contact atomic force microscopy microcantilever
has been discussed. In modeling and simulation of micro-cantilever in previous investigations, mass and moment of ...
A Hybrid Approach for Predicting User's Future Request
ناشر: IEEE
سال: 2014
Submicron liquid crystal pixels on a nanopatterned indium tin oxide surface
سال: 2002
خلاصه:
We have prepared a grooved indium tin oxide ~ITO! surface with groove widths of ;40–90 nm and
a variable groove separation up to 36 mm using atomic force microscopy nanolithography. Twisted
nematic pixels ...
Leveraging locality for FIB aggregation
ناشر: IEEE
سال: 2014
Design of Fractional Order Sliding Mode Controller for Chaos Suppression of Atomic Force Microscope System
سال: 2019
خلاصه:
A novel nonlinear fractional order sliding mode controller is proposed to control the chaotic atomic force microscope system in presence of uncertainties and disturbances. In the design of the suggested fractional order controller, conformable...