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Now showing items 1-10 of 35

A detection method of stick-slip state on wafer transfer surface and its sensor design

Type: Conference Paper

Publisher: IEEE

Year: 2014

Radiation-Hard Field-Programmable Gate Arrays Configuration Technique Using Silicon on Sapphire

Type: Journal Paper

Author : Haque, Kashfia; Beckett, Paul

Publisher: IEEE

Year: 2014

An efficient reliable PUF-based cryptographic key generator in 65nm CMOS

Type: Conference Paper

Author : Bhargava, M. , Mai, K.

Publisher: IEEE

Year: 2014

Business Models of Developer Platforms in the Telecommunications Industry -- An Explorative Case Study Analysis

Type: Conference Paper

Author : Kuebel, H. , Limbach, F. , Zarnekow, R.

Publisher: IEEE

Year: 2014

Remote dynamically reconfigurable platform using NetFPGA

Type: Conference Paper

Publisher: IEEE

Year: 2014

Temperature Sensor Front End in SOI CMOS Operating up to 250 <inline-formula> <img src="/images/tex/762.gif" alt="^{\\circ}\\hbox {C}"> </inline-formula>

Type: Journal Paper

Author : Pathrose, Jerrin; Lei Zou; Chai, Kevin T. C.; Minkyu Je; Yong Ping Xu

Publisher: IEEE

Year: 2014

Razor-Lite: A Light-Weight Register for Error Detection by Observing Virtual Supply Rails

Type: Journal Paper

Author : Inyong Kwon; Seongjong Kim; Fick, D.; Myungbo Kim; Yen-Po Chen; Sylvester, D.

Publisher: IEEE

Year: 2014

A 19 dBm, 15 Gbaud, 9 bit SOI CMOS Power-DAC Cell for High-Order QAM W-Band Transmitters

Type: Journal Paper

Author : Shopov, S.; Balteanu, A.; Voinigescu, S.P.

Publisher: IEEE

Year: 2014

Mismatch Characterization of Small Metal Fringe Capacitors

Type: Journal Paper

Author : Tripathi, Vaibhav; Murmann, Boris

Publisher: IEEE

Year: 2014

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

Type: Journal Paper

Author : Pellish, Jonathan /A/.; Marshall, Paul W.; Rodbell, Kenneth P.; Gordon, Michael S.; LaBel, Kenneth /A/.; Schwank, James R.; Dodds, Nathaniel /A/.; Castaneda, Carlos M.; Berg, Melanie D.; Kim, Hak S.; Phan, Anthony M.; Seidleck, Christina M.

Publisher: IEEE

Year: 2014

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A detection method of stick-slip state on wafer transfer surface and its sensor design

Radiation-Hard Field-Programmable Gate Arrays Configuration Technique Using Silicon on Sapphire

An efficient reliable PUF-based cryptographic key generator in 65nm CMOS

Business Models of Developer Platforms in the Telecommunications Industry -- An Explorative Case Study Analysis

Remote dynamically reconfigurable platform using NetFPGA

Temperature Sensor Front End in SOI CMOS Operating up to 250 <inline-formula> <img src="/images/tex/762.gif" alt="^{\\circ}\\hbox {C}"> </inline-formula>

Razor-Lite: A Light-Weight Register for Error Detection by Observing Virtual Supply Rails

A 19 dBm, 15 Gbaud, 9 bit SOI CMOS Power-DAC Cell for High-Order QAM W-Band Transmitters

Mismatch Characterization of Small Metal Fringe Capacitors

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

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A detection method of stick-slip state on wafer transfer surface and its sensor design

Radiation-Hard Field-Programmable Gate Arrays Configuration Technique Using Silicon on Sapphire

An efficient reliable PUF-based cryptographic key generator in 65nm CMOS

Business Models of Developer Platforms in the Telecommunications Industry -- An Explorative Case Study Analysis

Remote dynamically reconfigurable platform using NetFPGA

Temperature Sensor Front End in SOI CMOS Operating up to 250 <inline-formula> <img src="/images/tex/762.gif" alt="^{\\circ}\\hbox {C}"> </inline-formula>

Razor-Lite: A Light-Weight Register for Error Detection by Observing Virtual Supply Rails

A 19 dBm, 15 Gbaud, 9 bit SOI CMOS Power-DAC Cell for High-Order QAM W-Band Transmitters

Mismatch Characterization of Small Metal Fringe Capacitors

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies