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Accelerated vibration reliability testing of electronic assemblies using sine dwell with resonance tracking

Type: Conference Paper

Publisher: IEEE

Year: 2014

Analysis of NDVI Data for Crop Identification and Yield Estimation

Type: Journal Paper

Author : Jing Huang; Huimin Wang; Qiang Dai; Dawei Han

Publisher: IEEE

Year: 2014

Author

Dawei Han (1)

Huimin Wang (1)

Jing Huang (1)

Qiang Dai (1)

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IEEE (2)

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2014 (2)

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Qiubei county (2)

Akaikes information criterion (1)

BFAST (1)

BFAST approach (1)

Biological system modeling (1)

Breaks For Additive Seasonal and Trend (1)

China (1)

corn (1)

correlationbased approach (1)

crop filling period (1)

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Conference Paper (1)

Journal Paper (1)

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English (2)

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Metadata Only (2)

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lectronic Components and Technology Conference (ECTC), 2014 IEEE 64th (1)

Selected Topics in Applied Earth Observations and Remote Sensing, IEEE Journal of (1)

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