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نمایش تعداد 1-10 از 11
Robust design of HV pLDMOS-ESCR structures in a 60-V BCD process
ناشر: IEEE
سال: 2014
Cross-correlation as a new evaluation tool in pulsed eddy current defectoscopy
ناشر: IEEE
سال: 2014
Characteristics of ion-plasma coatings AlN-TiB2(TiSi2) after annealing
ناشر: IEEE
سال: 2014
Robust synchronization of directed Lur'e networks with incremental nonlinearities
ناشر: IEEE
سال: 2014