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Recovery of Electrical Characteristics of Au/n-Si Schottky Junction Under <inline-formula> <img src="/images/tex/21647.gif" alt="{}^{60}\\hbox {Co}"> </inline-formula> Gamma Irradiation

Type: Journal Paper

Author : Verma, Shalini; Praveen, Kumsi C.; Bobby, Achamma; Kanjilal, D.

Publisher: IEEE

Year: 2014

An Ambipolar Virtual-Source-Based Charge-Current Compact Model for Nanoscale Graphene Transistors

Type: Journal Paper

Author : Rakheja, Shaloo; Yanqing Wu; Han Wang; Palacios, T.; Avouris, Phaedon; Antoniadis, Dimitri /A/.

Publisher: IEEE

Year: 2014

Wireless monitoring system of the heart rate

Type: Conference Paper

Author : Paulet, Marius Valerian; Neacsu, Oana Maria; Salceanu, Andrei

Publisher: IEEE

Year: 2014

Terahertz near-field imaging for fractal metallic structures

Type: Conference Paper

Author : Tanaka, Tomoko; Tanaka, Koichiro

Publisher: IEEE

Year: 2014

Influence of Morphology on Current–Voltage Behavior of GaN Nanowires

Type: Journal Paper

Author : Blanchard, Paul T.; Bertness, K.A.; Brubaker, Matthew D.; Harvey, Todd E.; Sanders, Aric W.; Sanford, Norman /A/.

Publisher: IEEE

Year: 2014

Evaluation and Solutions for P/E Window Instability Induced by Electron Trapping in High-<inline-formula> <img src="/images/tex/19182.gif" alt="\\kappa "> </inline-formula> Intergate Dielectrics of Flash Memory Cells

Type: Journal Paper

Author : Baojun Tang; Wei Dong Zhang; Degraeve, Robin; Breuil, L.; Blomme, P.; Jian Fu Zhang; Zhigang Ji; Zahid, Mohammed; Toledano-Luque, Maria; Van den bosch, G.; Van Houdt, J.

Publisher: IEEE

Year: 2014

High-Performance a-IGZO Thin Film Diode as Selector for Cross-Point Memory Application

Type: Journal Paper

Author : Chasin, Adrian; Leqi Zhang; Bhoolokam, Ajay; Nag, Manoj; Steudel, Soeren; Govoreanu, B.; Gielen, G.; Heremans, Paul

Publisher: IEEE

Year: 2014

Conduction Mechanisms and Breakdown Characteristics of <formula formulatype="inline"> <img src="/images/tex/920.gif" alt="\\hbox {Al}_{2}\\hbox {O}_{3}"> </formula>-Doped <formula formulatype="inline"> <img src="/images/tex/592.gif" alt="\\hbox {ZrO}_{2}"> </formula> High-<formula formulatype="inline"> <img src="/images/tex/348.gif" alt="k"> </formula> D

Type: Journal Paper

Author : Knebel, S.; Schroeder, Ulrik; Dayu Zhou; Mikolajick, Thomas; Krautheim, Gunter

Publisher: IEEE

Year: 2014

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Recovery of Electrical Characteristics of Au/n-Si Schottky Junction Under <inline-formula> <img src="/images/tex/21647.gif" alt="{}^{60}\\hbox {Co}"> </inline-formula> Gamma Irradiation

An Ambipolar Virtual-Source-Based Charge-Current Compact Model for Nanoscale Graphene Transistors

Wireless monitoring system of the heart rate

Terahertz near-field imaging for fractal metallic structures

Influence of Morphology on Current–Voltage Behavior of GaN Nanowires

Evaluation and Solutions for P/E Window Instability Induced by Electron Trapping in High-<inline-formula> <img src="/images/tex/19182.gif" alt="\\kappa "> </inline-formula> Intergate Dielectrics of Flash Memory Cells

High-Performance a-IGZO Thin Film Diode as Selector for Cross-Point Memory Application

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Recovery of Electrical Characteristics of Au/n-Si Schottky Junction Under <inline-formula> <img src="/images/tex/21647.gif" alt="{}^{60}\\hbox {Co}"> </inline-formula> Gamma Irradiation

An Ambipolar Virtual-Source-Based Charge-Current Compact Model for Nanoscale Graphene Transistors

Wireless monitoring system of the heart rate

Terahertz near-field imaging for fractal metallic structures

Influence of Morphology on Current&#x2013;Voltage Behavior of GaN Nanowires

Evaluation and Solutions for P/E Window Instability Induced by Electron Trapping in High-<inline-formula> <img src="/images/tex/19182.gif" alt="\\kappa "> </inline-formula> Intergate Dielectrics of Flash Memory Cells

High-Performance a-IGZO Thin Film Diode as Selector for Cross-Point Memory Application

Influence of Morphology on Current–Voltage Behavior of GaN Nanowires