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A Fast <formula formulatype="inline"> <img src="/images/tex/21151.gif" alt="I{-}V"> </formula> Screening Measurement for TDDB Assessment of Ultra-Thick Inter-Metal Dielectrics

Type: Journal Paper

Author : Elhami Khorasani, Arash; Griswold, Mark; Alford, T.L.

Publisher: IEEE

Year: 2014

Modification of polyethylene properties by encapsulation of inorganic material

Type: Journal Paper

Author : Vanga-Bouanga, C.; Savoie, S.; Frechette, M.F.; David, E.

Publisher: IEEE

Year: 2014

Robust smoothing for estimating optical phase varying as a continuous resonant process

Type: Conference Paper

Publisher: IEEE

Year: 2014

Gate Leakage Characteristics for 28 nm HfZrO<sub><italic>x</italic></sub> pMOSFETs After DPN Process Treatment With Different Nitrogen Concentration

Type: Journal Paper

Author : Win-Der Lee; Mu-Chun Wang; Shea-Jue Wang; Chun-Wei Lian; Huang, L.S.

Publisher: IEEE

Year: 2014

A Novel Noncontact Surface Potential Monitor for Dielectrics Under Electrons Irradiation

Type: Journal Paper

Author : Chaoyang Zhou; Shengsheng Yang; Yi Wang; Xiaogang Qin; Kai Tian

Publisher: IEEE

Year: 2014

A Wearable Wrap-Around Sensor for Monitoring Deep Tissue Electric Properties

Type: Journal Paper

Author : Salman, Safa; Lee, Lanlin Z.; Volakis, J.L.

Publisher: IEEE

Year: 2014

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A Fast <formula formulatype="inline"> <img src="/images/tex/21151.gif" alt="I{-}V"> </formula> Screening Measurement for TDDB Assessment of Ultra-Thick Inter-Metal Dielectrics

Modification of polyethylene properties by encapsulation of inorganic material

Robust smoothing for estimating optical phase varying as a continuous resonant process

Gate Leakage Characteristics for 28 nm HfZrO<sub><italic>x</italic></sub> pMOSFETs After DPN Process Treatment With Different Nitrogen Concentration

A Novel Noncontact Surface Potential Monitor for Dielectrics Under Electrons Irradiation

A Wearable Wrap-Around Sensor for Monitoring Deep Tissue Electric Properties

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A Fast <formula formulatype="inline"> <img src="/images/tex/21151.gif" alt="I{-}V"> </formula> Screening Measurement for TDDB Assessment of Ultra-Thick Inter-Metal Dielectrics

Modification of polyethylene properties by encapsulation of inorganic material

Robust smoothing for estimating optical phase varying as a continuous resonant process

Gate Leakage Characteristics for 28 nm HfZrO<sub><italic>x</italic></sub> pMOSFETs After DPN Process Treatment With Different Nitrogen Concentration

A Novel Noncontact Surface Potential Monitor for Dielectrics Under Electrons Irradiation

A Wearable Wrap-Around Sensor for Monitoring Deep Tissue Electric Properties