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Now showing items 1-10 of 19

Impact of Process Variations on Reliability and Performance of 32-nm 6T SRAM at Near Threshold Voltage

Type: Conference Paper

Author : Lingbo Kou , Robinson, W.H.

Publisher: IEEE

Year: 2014

IEEE 342-node low voltage networked test system

Type: Conference Paper

Author : Schneider, K.; Phanivong, P.; Lacroix, J.-S.

Publisher: IEEE

Year: 2014

Fuzzification of protection settings — A new method for the evaluation of a nationwide protection system

Type: Conference Paper

Author : Dauer, M. , Jaeger, J. , Krebs, R. , Bopp, T.

Publisher: IEEE

Year: 2014

Radio wave propagation loss over terrain based on wide angle parabolic equation

Type: Conference Paper

Author : Xiaodi Liu , Xinli Zhou , Jinguang Xiao

Publisher: IEEE

Year: 2014

Modeling of HgCdTe photoconductive infrared detector with metallic nanostructures

Type: Conference Paper

Author : Liang, J.; Hu, W.D.; Chen, X.S.; Li, Z.F.; Lu, W.

Publisher: IEEE

Year: 2014

Parameter identification of circuit models for lead-acid batteries under non-zero initial conditions

Type: Conference Paper

Author : Devarakonda, L. , Haifeng Wang , Tingshu Hu

Publisher: IEEE

Year: 2014

Deep learning network for blind image quality assessment

Type: Conference Paper

Author : Gu, Ke; Zhai, Guangtao; Yang, Xiaokang; Zhang, Wenjun

Publisher: IEEE

Year: 2014

Microfabricated SOI pressure sensor using dynamically balanced lateral resonator

Type: Conference Paper

Publisher: IEEE

Year: 2014

Opportunistic Spectrum Access in Cognitive Radio Networks Under Imperfect Spectrum Sensing

Type: Journal Paper

Author : Altrad, Omar; Muhaidat, Sami; Al-Dweik, A.; Shami, A.; Yoo, Paul D.

Publisher: IEEE

Year: 2014

Temporal Traffic Dynamics Improve the Connectivity of Ad Hoc Cognitive Radio Networks

Type: Journal Paper

Author : Wei Ren; Qing Zhao; Swami, Ananthram

Publisher: IEEE

Year: 2014

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Impact of Process Variations on Reliability and Performance of 32-nm 6T SRAM at Near Threshold Voltage

IEEE 342-node low voltage networked test system

Fuzzification of protection settings — A new method for the evaluation of a nationwide protection system

Radio wave propagation loss over terrain based on wide angle parabolic equation

Modeling of HgCdTe photoconductive infrared detector with metallic nanostructures

Parameter identification of circuit models for lead-acid batteries under non-zero initial conditions

Deep learning network for blind image quality assessment

Microfabricated SOI pressure sensor using dynamically balanced lateral resonator

Opportunistic Spectrum Access in Cognitive Radio Networks Under Imperfect Spectrum Sensing

Temporal Traffic Dynamics Improve the Connectivity of Ad Hoc Cognitive Radio Networks

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Impact of Process Variations on Reliability and Performance of 32-nm 6T SRAM at Near Threshold Voltage

IEEE 342-node low voltage networked test system

Fuzzification of protection settings &#x2014; A new method for the evaluation of a nationwide protection system

Radio wave propagation loss over terrain based on wide angle parabolic equation

Modeling of HgCdTe photoconductive infrared detector with metallic nanostructures

Parameter identification of circuit models for lead-acid batteries under non-zero initial conditions

Deep learning network for blind image quality assessment

Microfabricated SOI pressure sensor using dynamically balanced lateral resonator

Opportunistic Spectrum Access in Cognitive Radio Networks Under Imperfect Spectrum Sensing

Temporal Traffic Dynamics Improve the Connectivity of Ad Hoc Cognitive Radio Networks

Fuzzification of protection settings — A new method for the evaluation of a nationwide protection system